Adhesion properties of MoS<sub>2</sub>/SiO<sub>2 </sub>interface: Size and temperature effects

Duan Cong; Liu Jun-Jie; Chen Yong-Jie; Zuo Hui-Ling; Dong Jian-Sheng; Ouyang Gang

doi:10.7498/aps.73.20231648

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Duan Cong, Liu Jun-Jie, Chen Yong-Jie, Zuo Hui-Ling, Dong Jian-Sheng, Ouyang Gang. Adhesion properties of MoS2/SiO2 interface: Size and temperature effectsJ. Acta Physica Sinica, 2024, 73(5): 056801. DOI: 10.7498/aps.73.20231648

Citation:

Duan Cong, Liu Jun-Jie, Chen Yong-Jie, Zuo Hui-Ling, Dong Jian-Sheng, Ouyang Gang. Adhesion properties of MoS2/SiO2 interface: Size and temperature effectsJ. Acta Physica Sinica, 2024, 73(5): 056801. DOI: 10.7498/aps.73.20231648

Citation:

Duan Cong, Liu Jun-Jie, Chen Yong-Jie, Zuo Hui-Ling, Dong Jian-Sheng, Ouyang Gang. Adhesion properties of MoS2/SiO2 interface: Size and temperature effectsJ. Acta Physica Sinica, 2024, 73(5): 056801. DOI: 10.7498/aps.73.20231648