Atomic structure imaging of WS<sub>2</sub>-MoSe<sub>2</sub> two-dimensional plane heterojunction interface using integrated differential phase contrast method

CAI Chen; SUN Huacong; LI Jiawei; ZHANG Guangyu; BAI Xuedong

doi:10.7498/aps.74.20250441

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CAI Chen, SUN Huacong, LI Jiawei, ZHANG Guangyu, BAI Xuedong. Atomic structure imaging of WS2-MoSe2 two-dimensional plane heterojunction interface using integrated differential phase contrast methodJ. Acta Physica Sinica, 2025, 74(14): 146801. DOI: 10.7498/aps.74.20250441

Citation:

CAI Chen, SUN Huacong, LI Jiawei, ZHANG Guangyu, BAI Xuedong. Atomic structure imaging of WS2-MoSe2 two-dimensional plane heterojunction interface using integrated differential phase contrast methodJ. Acta Physica Sinica, 2025, 74(14): 146801. DOI: 10.7498/aps.74.20250441

Citation:

CAI Chen, SUN Huacong, LI Jiawei, ZHANG Guangyu, BAI Xuedong. Atomic structure imaging of WS2-MoSe2 two-dimensional plane heterojunction interface using integrated differential phase contrast methodJ. Acta Physica Sinica, 2025, 74(14): 146801. DOI: 10.7498/aps.74.20250441