Analysis and experimental verification of dispersion characteristics of microstrip lines in terahertz low frequency band

XU Zhen; LUO Man; LIANG Bohan; LI Jining; ZHANG Jiaxin; WANG Tan; CHEN Kai; XU Degang

doi:10.7498/aps.74.20250690

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XU Zhen, LUO Man, LIANG Bohan, LI Jining, ZHANG Jiaxin, WANG Tan, CHEN Kai, XU Degang. Analysis and experimental verification of dispersion characteristics of microstrip lines in terahertz low frequency bandJ. Acta Physica Sinica, 2025, 74(21): 214204. DOI: 10.7498/aps.74.20250690

Citation:

XU Zhen, LUO Man, LIANG Bohan, LI Jining, ZHANG Jiaxin, WANG Tan, CHEN Kai, XU Degang. Analysis and experimental verification of dispersion characteristics of microstrip lines in terahertz low frequency bandJ. Acta Physica Sinica, 2025, 74(21): 214204. DOI: 10.7498/aps.74.20250690

Citation:

XU Zhen, LUO Man, LIANG Bohan, LI Jining, ZHANG Jiaxin, WANG Tan, CHEN Kai, XU Degang. Analysis and experimental verification of dispersion characteristics of microstrip lines in terahertz low frequency bandJ. Acta Physica Sinica, 2025, 74(21): 214204. DOI: 10.7498/aps.74.20250690