Methodology of X-ray emission spectroscopy and technical developments of tender X-ray emission spectrometers

LIU Dongmei; ZHENG Lei; TANG Kun; MA Chenyan; ZHAO Xiaojuan; WANG Yongyang; CHEN Dongliang; ZHAO Yidong; LIU Shuhu

doi:10.7498/aps.75.20260196

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LIU Dongmei, ZHENG Lei, TANG Kun, MA Chenyan, ZHAO Xiaojuan, WANG Yongyang, CHEN Dongliang, ZHAO Yidong, LIU Shuhu. Methodology of X-ray emission spectroscopy and technical developments of tender X-ray emission spectrometersJ. Acta Physica Sinica, 2026, 75(11): 110401. DOI: 10.7498/aps.75.20260196

Citation:

LIU Dongmei, ZHENG Lei, TANG Kun, MA Chenyan, ZHAO Xiaojuan, WANG Yongyang, CHEN Dongliang, ZHAO Yidong, LIU Shuhu. Methodology of X-ray emission spectroscopy and technical developments of tender X-ray emission spectrometersJ. Acta Physica Sinica, 2026, 75(11): 110401. DOI: 10.7498/aps.75.20260196

Citation:

LIU Dongmei, ZHENG Lei, TANG Kun, MA Chenyan, ZHAO Xiaojuan, WANG Yongyang, CHEN Dongliang, ZHAO Yidong, LIU Shuhu. Methodology of X-ray emission spectroscopy and technical developments of tender X-ray emission spectrometersJ. Acta Physica Sinica, 2026, 75(11): 110401. DOI: 10.7498/aps.75.20260196