1962, 18(4): 177-183.
DOI: 10.7498/aps.18.177
CSTR: 32037.14.aps.18.177
1962, 18(4): 184-187.
DOI: 10.7498/aps.18.184
CSTR: 32037.14.aps.18.184
1962, 18(4): 188-193.
DOI: 10.7498/aps.18.188
CSTR: 32037.14.aps.18.188
ON MEASUREMENT AND ANALYSIS OF FACTORS AFFECTING THE MAXIMUM FREQUENCY OF OSCILLATION OF TRANSISTORS
1962, 18(4): 194-206.
DOI: 10.7498/aps.18.194
CSTR: 32037.14.aps.18.194
1962, 18(4): 207-210.
DOI: 10.7498/aps.18.207
CSTR: 32037.14.aps.18.207
1962, 18(4): 211-217.
DOI: 10.7498/aps.18.211
CSTR: 32037.14.aps.18.211
1962, 18(4): 218-220.
DOI: 10.7498/aps.18.218
CSTR: 32037.14.aps.18.218


