THE MEASUREMENT OF THE LIFE TIME OF MINORITY CURRENT CARRIERS IN SEMICONDUCTORS BY OBSERVING THE PHOTO-CONDUCTIVE DECAY OF THE SPREADING RESISTANCE UNDER A POINT CONTACT

WANG SHOU-WU

doi:10.7498/aps.19.176

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WANG SHOU-WU. THE MEASUREMENT OF THE LIFE TIME OF MINORITY CURRENT CARRIERS IN SEMICONDUCTORS BY OBSERVING THE PHOTO-CONDUCTIVE DECAY OF THE SPREADING RESISTANCE UNDER A POINT CONTACTJ. Acta Physica Sinica, 1963, 19(3): 176-190. DOI: 10.7498/aps.19.176

Citation:

WANG SHOU-WU. THE MEASUREMENT OF THE LIFE TIME OF MINORITY CURRENT CARRIERS IN SEMICONDUCTORS BY OBSERVING THE PHOTO-CONDUCTIVE DECAY OF THE SPREADING RESISTANCE UNDER A POINT CONTACTJ. Acta Physica Sinica, 1963, 19(3): 176-190. DOI: 10.7498/aps.19.176

Citation:

WANG SHOU-WU. THE MEASUREMENT OF THE LIFE TIME OF MINORITY CURRENT CARRIERS IN SEMICONDUCTORS BY OBSERVING THE PHOTO-CONDUCTIVE DECAY OF THE SPREADING RESISTANCE UNDER A POINT CONTACTJ. Acta Physica Sinica, 1963, 19(3): 176-190. DOI: 10.7498/aps.19.176