Search

x
中国物理学会期刊
Advanced Search
ZHUANG WEI-HWA, PAN GUI-SHENG. MEASUREMENT OF MINORITY CARRIER LIFETIME IN Ge AND Si BY THE SPREADING-RESISTANCEPHOTO-DECAY METHODJ. Acta Physica Sinica, 1963, 19(3): 191-201. DOI: 10.7498/aps.19.191
Citation: ZHUANG WEI-HWA, PAN GUI-SHENG. MEASUREMENT OF MINORITY CARRIER LIFETIME IN Ge AND Si BY THE SPREADING-RESISTANCEPHOTO-DECAY METHODJ. Acta Physica Sinica, 1963, 19(3): 191-201. DOI: 10.7498/aps.19.191
shu

MEASUREMENT OF MINORITY CARRIER LIFETIME IN Ge AND Si BY THE SPREADING-RESISTANCEPHOTO-DECAY METHOD

Acta Phys. Sin., 1963, 19(3): 191-201.
DOI: 10.7498/aps.19.191
CSTR: 32037.14.aps.19.191
PDF
导出引用

  • Abstract

    Authors and contacts

    References

Turn off MathJax
Article Contents

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return