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中国物理学会期刊
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CHAI ZHEN-MING. RELIABILITY OF CIRCUIT ELEMENTS BY REDUNDANCY METHODJ. Acta Physica Sinica, 1964, 20(8): 705-719. DOI: 10.7498/aps.20.705
Citation: CHAI ZHEN-MING. RELIABILITY OF CIRCUIT ELEMENTS BY REDUNDANCY METHODJ. Acta Physica Sinica, 1964, 20(8): 705-719. DOI: 10.7498/aps.20.705
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RELIABILITY OF CIRCUIT ELEMENTS BY REDUNDANCY METHOD

Acta Phys. Sin., 1964, 20(8): 705-719.
DOI: 10.7498/aps.20.705
CSTR: 32037.14.aps.20.705
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