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中国物理学会期刊
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DING SHOU-CHAN. THE PROBE-WANDER ERROR OF FOUR-PROBE RESISTIVITY MEASUREMENTS ON SEMICONDUCTORJ. Acta Physica Sinica, 1966, 22(7): 798-808. DOI: 10.7498/aps.22.798
Citation: DING SHOU-CHAN. THE PROBE-WANDER ERROR OF FOUR-PROBE RESISTIVITY MEASUREMENTS ON SEMICONDUCTORJ. Acta Physica Sinica, 1966, 22(7): 798-808. DOI: 10.7498/aps.22.798
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THE PROBE-WANDER ERROR OF FOUR-PROBE RESISTIVITY MEASUREMENTS ON SEMICONDUCTOR

Acta Phys. Sin., 1966, 22(7): 798-808.
DOI: 10.7498/aps.22.798
CSTR: 32037.14.aps.22.798
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