MEASUREMENTS OF RESISTIVITY AND HALL EFFECT IN SILICON CARBIDE BY THE VAN DER PAUW METHOD

FUNG SI-CHI; LOG BIN-CHANG; TON FU-DI; CHANG YEN-SING; HONG FU-GUN; TAM HOA-YEN

doi:10.7498/aps.22.967

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FUNG SI-CHI, LOG BIN-CHANG, TON FU-DI, CHANG YEN-SING, HONG FU-GUN, TAM HOA-YEN. MEASUREMENTS OF RESISTIVITY AND HALL EFFECT IN SILICON CARBIDE BY THE VAN DER PAUW METHODJ. Acta Physica Sinica, 1966, 22(9): 967-975. DOI: 10.7498/aps.22.967

Citation:

FUNG SI-CHI, LOG BIN-CHANG, TON FU-DI, CHANG YEN-SING, HONG FU-GUN, TAM HOA-YEN. MEASUREMENTS OF RESISTIVITY AND HALL EFFECT IN SILICON CARBIDE BY THE VAN DER PAUW METHODJ. Acta Physica Sinica, 1966, 22(9): 967-975. DOI: 10.7498/aps.22.967

Citation:

FUNG SI-CHI, LOG BIN-CHANG, TON FU-DI, CHANG YEN-SING, HONG FU-GUN, TAM HOA-YEN. MEASUREMENTS OF RESISTIVITY AND HALL EFFECT IN SILICON CARBIDE BY THE VAN DER PAUW METHODJ. Acta Physica Sinica, 1966, 22(9): 967-975. DOI: 10.7498/aps.22.967