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中国物理学会期刊
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YUI SHOU-DUNG, WOO DAU-WEI, TON FU-DI, TAM HOA-YEN. MINORITY CARRIER LIFETIME IN SILICON CARBIDE BY THE ELECTROLUMINESCENCE METHODJ. Acta Physica Sinica, 1966, 22(9): 976-981. DOI: 10.7498/aps.22.976
Citation: YUI SHOU-DUNG, WOO DAU-WEI, TON FU-DI, TAM HOA-YEN. MINORITY CARRIER LIFETIME IN SILICON CARBIDE BY THE ELECTROLUMINESCENCE METHODJ. Acta Physica Sinica, 1966, 22(9): 976-981. DOI: 10.7498/aps.22.976
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MINORITY CARRIER LIFETIME IN SILICON CARBIDE BY THE ELECTROLUMINESCENCE METHOD

Acta Phys. Sin., 1966, 22(9): 976-981.
DOI: 10.7498/aps.22.976
CSTR: 32037.14.aps.22.976
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