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中国物理学会期刊
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WANG WEI-YUAN. MEASUREMENT OF CARRIER LIFETIME OF GaAs DIODES WITH p-n AND M-S JUNCTIONS BY STEP RECOVERY METHODJ. Acta Physica Sinica, 1979, 28(3): 341-349. DOI: 10.7498/aps.28.341
Citation: WANG WEI-YUAN. MEASUREMENT OF CARRIER LIFETIME OF GaAs DIODES WITH p-n AND M-S JUNCTIONS BY STEP RECOVERY METHODJ. Acta Physica Sinica, 1979, 28(3): 341-349. DOI: 10.7498/aps.28.341
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MEASUREMENT OF CARRIER LIFETIME OF GaAs DIODES WITH p-n AND M-S JUNCTIONS BY STEP RECOVERY METHOD

Acta Phys. Sin., 1979, 28(3): 341-349.
DOI: 10.7498/aps.28.341
CSTR: 32037.14.aps.28.341
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