THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHY

MAI ZHEN-HONG; GE PEI-WEN; CUI SHU-FAN; WU LAN-SHENG

doi:10.7498/aps.30.1106

MAI ZHEN-HONG, GE PEI-WEN, CUI SHU-FAN, WU LAN-SHENG. THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHYJ. Acta Physica Sinica, 1981, 30(8): 1106-1110. DOI: 10.7498/aps.30.1106

Citation:

MAI ZHEN-HONG, GE PEI-WEN, CUI SHU-FAN, WU LAN-SHENG. THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHYJ. Acta Physica Sinica, 1981, 30(8): 1106-1110. DOI: 10.7498/aps.30.1106

Citation:

MAI ZHEN-HONG, GE PEI-WEN, CUI SHU-FAN, WU LAN-SHENG. THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHYJ. Acta Physica Sinica, 1981, 30(8): 1106-1110. DOI: 10.7498/aps.30.1106