THE STUDY OF THE TRANSITION REGION AT THE INTERFACE OF Si-SiO2 BY XPS

LIN RONG-FU; DAI DAO-XUAN; JIANG SHAO-YOU; ZHANG YONG-FU; BAO WEI-GUO; LU GUO-LIANG

doi:10.7498/aps.30.1295

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LIN RONG-FU, DAI DAO-XUAN, JIANG SHAO-YOU, ZHANG YONG-FU, BAO WEI-GUO, LU GUO-LIANG. THE STUDY OF THE TRANSITION REGION AT THE INTERFACE OF Si-SiO2 BY XPSJ. Acta Physica Sinica, 1981, 30(10): 1295-1306. DOI: 10.7498/aps.30.1295

Citation:

LIN RONG-FU, DAI DAO-XUAN, JIANG SHAO-YOU, ZHANG YONG-FU, BAO WEI-GUO, LU GUO-LIANG. THE STUDY OF THE TRANSITION REGION AT THE INTERFACE OF Si-SiO2 BY XPSJ. Acta Physica Sinica, 1981, 30(10): 1295-1306. DOI: 10.7498/aps.30.1295

Citation:

LIN RONG-FU, DAI DAO-XUAN, JIANG SHAO-YOU, ZHANG YONG-FU, BAO WEI-GUO, LU GUO-LIANG. THE STUDY OF THE TRANSITION REGION AT THE INTERFACE OF Si-SiO2 BY XPSJ. Acta Physica Sinica, 1981, 30(10): 1295-1306. DOI: 10.7498/aps.30.1295