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中国物理学会期刊
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LIN LI-BIN, TIAN JING-WEN, XIE JIAN-HUA. THE PRINCIPLE OF ACCURATE MEASUREMENT OF THICKNESS OF COMPOUND THIN FILMSJ. Acta Physica Sinica, 1981, 30(5): 650-660. DOI: 10.7498/aps.30.650
Citation: LIN LI-BIN, TIAN JING-WEN, XIE JIAN-HUA. THE PRINCIPLE OF ACCURATE MEASUREMENT OF THICKNESS OF COMPOUND THIN FILMSJ. Acta Physica Sinica, 1981, 30(5): 650-660. DOI: 10.7498/aps.30.650
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THE PRINCIPLE OF ACCURATE MEASUREMENT OF THICKNESS OF COMPOUND THIN FILMS

Acta Phys. Sin., 1981, 30(5): 650-660.
DOI: 10.7498/aps.30.650
CSTR: 32037.14.aps.30.650
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