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中国物理学会期刊
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CHENG WAN-BONG, GAO QIAO-JUN, WU ZI-QIN. SIMULTANEOUS MEASUREMENT OF THE CONSTITUENT AND THICKNESS OF THIN FILM BY X-RAY EDSJ. Acta Physica Sinica, 1982, 31(1): 30-37. DOI: 10.7498/aps.31.30
Citation: CHENG WAN-BONG, GAO QIAO-JUN, WU ZI-QIN. SIMULTANEOUS MEASUREMENT OF THE CONSTITUENT AND THICKNESS OF THIN FILM BY X-RAY EDSJ. Acta Physica Sinica, 1982, 31(1): 30-37. DOI: 10.7498/aps.31.30
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SIMULTANEOUS MEASUREMENT OF THE CONSTITUENT AND THICKNESS OF THIN FILM BY X-RAY EDS

Acta Phys. Sin., 1982, 31(1): 30-37.
DOI: 10.7498/aps.31.30
CSTR: 32037.14.aps.31.30
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