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中国物理学会期刊
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QIAN YOU-HUA, CHEN LIANG-YAO. ELECTROLYTE ELECTROREFLECTANCE (EER) SPECTROSCOPY OF ION IMPLANTED SILICON LAYERJ. Acta Physica Sinica, 1982, 31(5): 646-653. DOI: 10.7498/aps.31.646
Citation: QIAN YOU-HUA, CHEN LIANG-YAO. ELECTROLYTE ELECTROREFLECTANCE (EER) SPECTROSCOPY OF ION IMPLANTED SILICON LAYERJ. Acta Physica Sinica, 1982, 31(5): 646-653. DOI: 10.7498/aps.31.646
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ELECTROLYTE ELECTROREFLECTANCE (EER) SPECTROSCOPY OF ION IMPLANTED SILICON LAYER

Acta Phys. Sin., 1982, 31(5): 646-653.
DOI: 10.7498/aps.31.646
CSTR: 32037.14.aps.31.646
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