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中国物理学会期刊
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LI MING-FU. STRESS DEPENDENCE OF DEFECT LEVELS IN SEMICONDUCTORSJ. Acta Physica Sinica, 1985, 34(12): 1549-1558. DOI: 10.7498/aps.34.1549
Citation: LI MING-FU. STRESS DEPENDENCE OF DEFECT LEVELS IN SEMICONDUCTORSJ. Acta Physica Sinica, 1985, 34(12): 1549-1558. DOI: 10.7498/aps.34.1549
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STRESS DEPENDENCE OF DEFECT LEVELS IN SEMICONDUCTORS

Acta Phys. Sin., 1985, 34(12): 1549-1558.
DOI: 10.7498/aps.34.1549
CSTR: 32037.14.aps.34.1549
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