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中国物理学会期刊
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HUANG BING-ZHONG, YU YU-ZHEN, HONG GUO-GUANG. THE ROUGHNESS OF THE Si-SiO2 INTERFACEJ. Acta Physica Sinica, 1987, 36(7): 829-837. DOI: 10.7498/aps.36.829
Citation: HUANG BING-ZHONG, YU YU-ZHEN, HONG GUO-GUANG. THE ROUGHNESS OF THE Si-SiO2 INTERFACEJ. Acta Physica Sinica, 1987, 36(7): 829-837. DOI: 10.7498/aps.36.829
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THE ROUGHNESS OF THE Si-SiO2 INTERFACE

Acta Phys. Sin., 1987, 36(7): 829-837.
DOI: 10.7498/aps.36.829
CSTR: 32037.14.aps.36.829
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