ELECTRON SPIN RESONANCE INVESTIGATION ON Si-H BONDS AND H-INDUCED DEFECTS IN SINGLE CRYSTALS OF SILICON

SU FANG; C. LEE; P. C. TAYLOR

doi:10.7498/aps.37.1053

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SU FANG, C. LEE, P. C. TAYLOR. ELECTRON SPIN RESONANCE INVESTIGATION ON Si-H BONDS AND H-INDUCED DEFECTS IN SINGLE CRYSTALS OF SILICONJ. Acta Physica Sinica, 1988, 37(7): 1053-1058. DOI: 10.7498/aps.37.1053

Citation:

SU FANG, C. LEE, P. C. TAYLOR. ELECTRON SPIN RESONANCE INVESTIGATION ON Si-H BONDS AND H-INDUCED DEFECTS IN SINGLE CRYSTALS OF SILICONJ. Acta Physica Sinica, 1988, 37(7): 1053-1058. DOI: 10.7498/aps.37.1053

Citation:

SU FANG, C. LEE, P. C. TAYLOR. ELECTRON SPIN RESONANCE INVESTIGATION ON Si-H BONDS AND H-INDUCED DEFECTS IN SINGLE CRYSTALS OF SILICONJ. Acta Physica Sinica, 1988, 37(7): 1053-1058. DOI: 10.7498/aps.37.1053