THE EFFECT OF ELECTRON DIFFRACTION CONDITIONS ON RHEED INTENSITY OSCILLATIONS DURING Si(111) MBE

CHEN KE-MING; ZHOU TIE-CHENG; FAN YONG-LIANG; SHENG CHI; YU MING-REN

doi:10.7498/aps.39.1937

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CHEN KE-MING, ZHOU TIE-CHENG, FAN YONG-LIANG, SHENG CHI, YU MING-REN. THE EFFECT OF ELECTRON DIFFRACTION CONDITIONS ON RHEED INTENSITY OSCILLATIONS DURING Si(111) MBEJ. Acta Physica Sinica, 1990, 39(12): 1937-1944. DOI: 10.7498/aps.39.1937

Citation:

CHEN KE-MING, ZHOU TIE-CHENG, FAN YONG-LIANG, SHENG CHI, YU MING-REN. THE EFFECT OF ELECTRON DIFFRACTION CONDITIONS ON RHEED INTENSITY OSCILLATIONS DURING Si(111) MBEJ. Acta Physica Sinica, 1990, 39(12): 1937-1944. DOI: 10.7498/aps.39.1937

Citation:

CHEN KE-MING, ZHOU TIE-CHENG, FAN YONG-LIANG, SHENG CHI, YU MING-REN. THE EFFECT OF ELECTRON DIFFRACTION CONDITIONS ON RHEED INTENSITY OSCILLATIONS DURING Si(111) MBEJ. Acta Physica Sinica, 1990, 39(12): 1937-1944. DOI: 10.7498/aps.39.1937