Search

x
中国物理学会期刊
Advanced Search
ZHU NAN-CHANG, LI RUN-SHEN, XU SHUN-SHENG. INVESTIGATION OF THE SEMICONDUCTOR STRAINED SUPERLATTICE STRUCTURE AND INTERFACE BY X-RAY ROCKING-CURVE ANALYSISJ. Acta Physica Sinica, 1991, 40(3): 433-440. DOI: 10.7498/aps.40.433
Citation: ZHU NAN-CHANG, LI RUN-SHEN, XU SHUN-SHENG. INVESTIGATION OF THE SEMICONDUCTOR STRAINED SUPERLATTICE STRUCTURE AND INTERFACE BY X-RAY ROCKING-CURVE ANALYSISJ. Acta Physica Sinica, 1991, 40(3): 433-440. DOI: 10.7498/aps.40.433
shu

INVESTIGATION OF THE SEMICONDUCTOR STRAINED SUPERLATTICE STRUCTURE AND INTERFACE BY X-RAY ROCKING-CURVE ANALYSIS

Acta Phys. Sin., 1991, 40(3): 433-440.
DOI: 10.7498/aps.40.433
CSTR: 32037.14.aps.40.433
PDF
导出引用

  • Abstract

    Authors and contacts

    References

Turn off MathJax
Article Contents

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return