SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF GexSi1-x/Si SUPERLATTICE

ZHOU GUO-LIANG; SHEN XIAO-LIANG; SHENG CHI; JIANG WEI-DONG; YU MING-REN

doi:10.7498/aps.40.56

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ZHOU GUO-LIANG, SHEN XIAO-LIANG, SHENG CHI, JIANG WEI-DONG, YU MING-REN. SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF GexSi1-x/Si SUPERLATTICEJ. Acta Physica Sinica, 1991, 40(1): 56-63. DOI: 10.7498/aps.40.56

Citation:

ZHOU GUO-LIANG, SHEN XIAO-LIANG, SHENG CHI, JIANG WEI-DONG, YU MING-REN. SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF GexSi1-x/Si SUPERLATTICEJ. Acta Physica Sinica, 1991, 40(1): 56-63. DOI: 10.7498/aps.40.56

Citation:

ZHOU GUO-LIANG, SHEN XIAO-LIANG, SHENG CHI, JIANG WEI-DONG, YU MING-REN. SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF GexSi1-x/Si SUPERLATTICEJ. Acta Physica Sinica, 1991, 40(1): 56-63. DOI: 10.7498/aps.40.56