STRUCTURE EFFECT OF SPUTTERRED SILICON CLUSTERS STUDIED BY MEANS OF TIME-OF-FLIGHT METHOD

Liu Shu-rong; Jiang Wei-lin; Liu Jia-rui; Lin Yin-nong

doi:10.7498/aps.40.703

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Liu Shu-rong, Jiang Wei-lin, Liu Jia-rui, Lin Yin-nong. STRUCTURE EFFECT OF SPUTTERRED SILICON CLUSTERS STUDIED BY MEANS OF TIME-OF-FLIGHT METHODJ. Acta Physica Sinica, 1991, 40(5): 703-708. DOI: 10.7498/aps.40.703

Citation:

Liu Shu-rong, Jiang Wei-lin, Liu Jia-rui, Lin Yin-nong. STRUCTURE EFFECT OF SPUTTERRED SILICON CLUSTERS STUDIED BY MEANS OF TIME-OF-FLIGHT METHODJ. Acta Physica Sinica, 1991, 40(5): 703-708. DOI: 10.7498/aps.40.703

Citation:

Liu Shu-rong, Jiang Wei-lin, Liu Jia-rui, Lin Yin-nong. STRUCTURE EFFECT OF SPUTTERRED SILICON CLUSTERS STUDIED BY MEANS OF TIME-OF-FLIGHT METHODJ. Acta Physica Sinica, 1991, 40(5): 703-708. DOI: 10.7498/aps.40.703