BEHAVIOUR OF X-RAY DIFFRACTION FROM UNIFORMLY BENT Si CRYSTAL

YANG PING. BEHAVIOUR OF X-RAY DIFFRACTION FROM UNIFORMLY BENT Si CRYSTALJ. Acta Physica Sinica, 1992, 41(2): 267-271. DOI: 10.7498/aps.41.267

Citation:

YANG PING. BEHAVIOUR OF X-RAY DIFFRACTION FROM UNIFORMLY BENT Si CRYSTALJ. Acta Physica Sinica, 1992, 41(2): 267-271. DOI: 10.7498/aps.41.267

Citation:

YANG PING. BEHAVIOUR OF X-RAY DIFFRACTION FROM UNIFORMLY BENT Si CRYSTALJ. Acta Physica Sinica, 1992, 41(2): 267-271. DOI: 10.7498/aps.41.267

Acta Phys. Sin., 1992, 41(2): 267-271.

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