DYNAMIC STORAGE TIME MEASUREMENTS OF N-TYPE Hg1-xCdxTe METAL-INSULATOR-SEMICONDUCTOR DEVICES

HUANG HE; TANG DING-YUAN; TONG FEI-MING; ZHENG GUO-ZHEN

doi:10.7498/aps.43.1883

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HUANG HE, TANG DING-YUAN, TONG FEI-MING, ZHENG GUO-ZHEN. DYNAMIC STORAGE TIME MEASUREMENTS OF N-TYPE Hg1-xCdxTe METAL-INSULATOR-SEMICONDUCTOR DEVICESJ. Acta Physica Sinica, 1994, 43(11): 1883-1888. DOI: 10.7498/aps.43.1883

Citation:

HUANG HE, TANG DING-YUAN, TONG FEI-MING, ZHENG GUO-ZHEN. DYNAMIC STORAGE TIME MEASUREMENTS OF N-TYPE Hg1-xCdxTe METAL-INSULATOR-SEMICONDUCTOR DEVICESJ. Acta Physica Sinica, 1994, 43(11): 1883-1888. DOI: 10.7498/aps.43.1883

Citation:

HUANG HE, TANG DING-YUAN, TONG FEI-MING, ZHENG GUO-ZHEN. DYNAMIC STORAGE TIME MEASUREMENTS OF N-TYPE Hg1-xCdxTe METAL-INSULATOR-SEMICONDUCTOR DEVICESJ. Acta Physica Sinica, 1994, 43(11): 1883-1888. DOI: 10.7498/aps.43.1883