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中国物理学会期刊
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LUO JIAN, TAO KUN. COMPUTER DEPTH PROFILING ANALYSIS METHOD FOR X-RAY DIFFRACTION POLYCRYSTALLINE PATTERNSJ. Acta Physica Sinica, 1995, 44(11): 1793-1797. DOI: 10.7498/aps.44.1793
Citation: LUO JIAN, TAO KUN. COMPUTER DEPTH PROFILING ANALYSIS METHOD FOR X-RAY DIFFRACTION POLYCRYSTALLINE PATTERNSJ. Acta Physica Sinica, 1995, 44(11): 1793-1797. DOI: 10.7498/aps.44.1793
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COMPUTER DEPTH PROFILING ANALYSIS METHOD FOR X-RAY DIFFRACTION POLYCRYSTALLINE PATTERNS

Acta Phys. Sin., 1995, 44(11): 1793-1797.
DOI: 10.7498/aps.44.1793
CSTR: 32037.14.aps.44.1793
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