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中国物理学会期刊
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LIU HONG-CHAO, GUO CHANG-LIN. X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPESJ. Acta Physica Sinica, 1997, 46(3): 524-529. DOI: 10.7498/aps.46.524
Citation: LIU HONG-CHAO, GUO CHANG-LIN. X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPESJ. Acta Physica Sinica, 1997, 46(3): 524-529. DOI: 10.7498/aps.46.524
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X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPES

Acta Phys. Sin., 1997, 46(3): 524-529.
DOI: 10.7498/aps.46.524
CSTR: 32037.14.aps.46.524
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