XU ZHANG-CHENG, GUO CHANG-LIN, ZHAO ZONG-YAN, XU JIA-YUE, ZHOU SHENG-MING, QI ZE-MING, T. FUKAMACHI, R. NEGISHI, T. NAKAJIMA. RESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTORJ. Acta Physica Sinica, 1998, 47(9): 1520-1528. DOI: 10.7498/aps.47.1520
|
Citation:
|
XU ZHANG-CHENG, GUO CHANG-LIN, ZHAO ZONG-YAN, XU JIA-YUE, ZHOU SHENG-MING, QI ZE-MING, T. FUKAMACHI, R. NEGISHI, T. NAKAJIMA. RESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTORJ. Acta Physica Sinica, 1998, 47(9): 1520-1528. DOI: 10.7498/aps.47.1520
|
XU ZHANG-CHENG, GUO CHANG-LIN, ZHAO ZONG-YAN, XU JIA-YUE, ZHOU SHENG-MING, QI ZE-MING, T. FUKAMACHI, R. NEGISHI, T. NAKAJIMA. RESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTORJ. Acta Physica Sinica, 1998, 47(9): 1520-1528. DOI: 10.7498/aps.47.1520
|
Citation:
|
XU ZHANG-CHENG, GUO CHANG-LIN, ZHAO ZONG-YAN, XU JIA-YUE, ZHOU SHENG-MING, QI ZE-MING, T. FUKAMACHI, R. NEGISHI, T. NAKAJIMA. RESONANT X-RAY DYNAMICAL DIFFRACTION METHOD FOR DETERMINING TEMPERATURE FACTORJ. Acta Physica Sinica, 1998, 47(9): 1520-1528. DOI: 10.7498/aps.47.1520
|
DownLoad: