Lv YONG-LIANG, ZHOU SHI-PING, XU DE-MING. ANALYSIS OF PROPERTIES OF HIGH-ELECTRON-MOBILITY-TRANSISTOR UNDER OPTICAL ILLUMI NATIONJ. Acta Physica Sinica, 2000, 49(7): 1394-1399. DOI: 10.7498/aps.49.1394
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Citation:
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Lv YONG-LIANG, ZHOU SHI-PING, XU DE-MING. ANALYSIS OF PROPERTIES OF HIGH-ELECTRON-MOBILITY-TRANSISTOR UNDER OPTICAL ILLUMI NATIONJ. Acta Physica Sinica, 2000, 49(7): 1394-1399. DOI: 10.7498/aps.49.1394
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Lv YONG-LIANG, ZHOU SHI-PING, XU DE-MING. ANALYSIS OF PROPERTIES OF HIGH-ELECTRON-MOBILITY-TRANSISTOR UNDER OPTICAL ILLUMI NATIONJ. Acta Physica Sinica, 2000, 49(7): 1394-1399. DOI: 10.7498/aps.49.1394
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Citation:
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Lv YONG-LIANG, ZHOU SHI-PING, XU DE-MING. ANALYSIS OF PROPERTIES OF HIGH-ELECTRON-MOBILITY-TRANSISTOR UNDER OPTICAL ILLUMI NATIONJ. Acta Physica Sinica, 2000, 49(7): 1394-1399. DOI: 10.7498/aps.49.1394
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