DETERMINATION OF THE AVERAGE THICKNESS OF INTERFACE LAYER WRAPPED ABOUT SiO2 SOLS BY SAXS

LI ZHI-HONG; GONG YAN-JUN; WU DONG; SUN YU-HAN; WANG JUN; LIU YI; DONG BAO-ZHONG

doi:10.7498/aps.50.1128

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LI ZHI-HONG, GONG YAN-JUN, WU DONG, SUN YU-HAN, WANG JUN, LIU YI, DONG BAO-ZHONG. DETERMINATION OF THE AVERAGE THICKNESS OF INTERFACE LAYER WRAPPED ABOUT SiO2 SOLS BY SAXSJ. Acta Physica Sinica, 2001, 50(6): 1128-1131. DOI: 10.7498/aps.50.1128

Citation:

LI ZHI-HONG, GONG YAN-JUN, WU DONG, SUN YU-HAN, WANG JUN, LIU YI, DONG BAO-ZHONG. DETERMINATION OF THE AVERAGE THICKNESS OF INTERFACE LAYER WRAPPED ABOUT SiO2 SOLS BY SAXSJ. Acta Physica Sinica, 2001, 50(6): 1128-1131. DOI: 10.7498/aps.50.1128

Citation:

LI ZHI-HONG, GONG YAN-JUN, WU DONG, SUN YU-HAN, WANG JUN, LIU YI, DONG BAO-ZHONG. DETERMINATION OF THE AVERAGE THICKNESS OF INTERFACE LAYER WRAPPED ABOUT SiO2 SOLS BY SAXSJ. Acta Physica Sinica, 2001, 50(6): 1128-1131. DOI: 10.7498/aps.50.1128