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中国物理学会期刊
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SHANG YE-CHUN, ZHANG YI-MEN, ZHANG YU-MING. MONTE CARLO STUDY ON INTERFACE ROUGHNESS DEPENDENCE OF ELECTRON MOBILITY IN 6H-SiC INVERSION LAYERSJ. Acta Physica Sinica, 2001, 50(7): 1350-1354. DOI: 10.7498/aps.50.1350
Citation: SHANG YE-CHUN, ZHANG YI-MEN, ZHANG YU-MING. MONTE CARLO STUDY ON INTERFACE ROUGHNESS DEPENDENCE OF ELECTRON MOBILITY IN 6H-SiC INVERSION LAYERSJ. Acta Physica Sinica, 2001, 50(7): 1350-1354. DOI: 10.7498/aps.50.1350
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MONTE CARLO STUDY ON INTERFACE ROUGHNESS DEPENDENCE OF ELECTRON MOBILITY IN 6H-SiC INVERSION LAYERS

Acta Phys. Sin., 2001, 50(7): 1350-1354.
DOI: 10.7498/aps.50.1350
CSTR: 32037.14.aps.50.1350
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