STRUCTURAL CHARACTERIZATION OF C3N4 THIN FILMS SYNTHESIZED BY MICROWAVE PLASMA CHEMICAL VAPOR DEPOSITION

ZHANG YONG-PING; GU YOU-SONG; GAO HONG-JUN; ZHANG XIU-FANG

doi:10.7498/aps.50.1396

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ZHANG YONG-PING, GU YOU-SONG, GAO HONG-JUN, ZHANG XIU-FANG. STRUCTURAL CHARACTERIZATION OF C3N4 THIN FILMS SYNTHESIZED BY MICROWAVE PLASMA CHEMICAL VAPOR DEPOSITIONJ. Acta Physica Sinica, 2001, 50(7): 1396-1400. DOI: 10.7498/aps.50.1396

Citation:

ZHANG YONG-PING, GU YOU-SONG, GAO HONG-JUN, ZHANG XIU-FANG. STRUCTURAL CHARACTERIZATION OF C3N4 THIN FILMS SYNTHESIZED BY MICROWAVE PLASMA CHEMICAL VAPOR DEPOSITIONJ. Acta Physica Sinica, 2001, 50(7): 1396-1400. DOI: 10.7498/aps.50.1396

Citation:

ZHANG YONG-PING, GU YOU-SONG, GAO HONG-JUN, ZHANG XIU-FANG. STRUCTURAL CHARACTERIZATION OF C3N4 THIN FILMS SYNTHESIZED BY MICROWAVE PLASMA CHEMICAL VAPOR DEPOSITIONJ. Acta Physica Sinica, 2001, 50(7): 1396-1400. DOI: 10.7498/aps.50.1396