STUDY ON A METHOD OF THE THICKNESS MEASUREMENT OF   ULTRA-THIN PtSi FILM

LIU SHUANG; NING YONG-GONG; ZHANG YI; ZHANG HUAI-WU; CHEN AI; LIU JUN-GANG; YANG JIA-DE; LI KUN

doi:10.7498/aps.50.1447

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LIU SHUANG, NING YONG-GONG, ZHANG YI, ZHANG HUAI-WU, CHEN AI, LIU JUN-GANG, YANG JIA-DE, LI KUN. STUDY ON A METHOD OF THE THICKNESS MEASUREMENT OF ULTRA-THIN PtSi FILMJ. Acta Physica Sinica, 2001, 50(8): 1447-1450. DOI: 10.7498/aps.50.1447

Citation:

LIU SHUANG, NING YONG-GONG, ZHANG YI, ZHANG HUAI-WU, CHEN AI, LIU JUN-GANG, YANG JIA-DE, LI KUN. STUDY ON A METHOD OF THE THICKNESS MEASUREMENT OF ULTRA-THIN PtSi FILMJ. Acta Physica Sinica, 2001, 50(8): 1447-1450. DOI: 10.7498/aps.50.1447

Citation:

LIU SHUANG, NING YONG-GONG, ZHANG YI, ZHANG HUAI-WU, CHEN AI, LIU JUN-GANG, YANG JIA-DE, LI KUN. STUDY ON A METHOD OF THE THICKNESS MEASUREMENT OF ULTRA-THIN PtSi FILMJ. Acta Physica Sinica, 2001, 50(8): 1447-1450. DOI: 10.7498/aps.50.1447