Investigation of stable high-index silicon surfacesby means of LEED pattern analysis

Jiang Jin-Long; Li Wen-Jie; Zhou Li; Zhao Ru-Guang; Yang Wei-Sheng

doi:10.7498/aps.52.156

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Jiang Jin-Long, Li Wen-Jie, Zhou Li, Zhao Ru-Guang, Yang Wei-Sheng. Investigation of stable high-index silicon surfacesby means of LEED pattern analysisJ. Acta Physica Sinica, 2003, 52(1): 156-162. DOI: 10.7498/aps.52.156

Citation:

Jiang Jin-Long, Li Wen-Jie, Zhou Li, Zhao Ru-Guang, Yang Wei-Sheng. Investigation of stable high-index silicon surfacesby means of LEED pattern analysisJ. Acta Physica Sinica, 2003, 52(1): 156-162. DOI: 10.7498/aps.52.156

Citation:

Jiang Jin-Long, Li Wen-Jie, Zhou Li, Zhao Ru-Guang, Yang Wei-Sheng. Investigation of stable high-index silicon surfacesby means of LEED pattern analysisJ. Acta Physica Sinica, 2003, 52(1): 156-162. DOI: 10.7498/aps.52.156