Luo Zhi, Lin Xuan-Ying, Lin Shun-Hui, Yu Chu-Ying, Lin Kui-Xun, Yu Yun-Peng, Tan Wei-Feng. Infrared analysis on hydrogen content and Si-H bonding configurations of hydrogenated amorphous silicon filmsJ. Acta Physica Sinica, 2003, 52(1): 169-174. DOI: 10.7498/aps.52.169
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Citation:
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Luo Zhi, Lin Xuan-Ying, Lin Shun-Hui, Yu Chu-Ying, Lin Kui-Xun, Yu Yun-Peng, Tan Wei-Feng. Infrared analysis on hydrogen content and Si-H bonding configurations of hydrogenated amorphous silicon filmsJ. Acta Physica Sinica, 2003, 52(1): 169-174. DOI: 10.7498/aps.52.169
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Luo Zhi, Lin Xuan-Ying, Lin Shun-Hui, Yu Chu-Ying, Lin Kui-Xun, Yu Yun-Peng, Tan Wei-Feng. Infrared analysis on hydrogen content and Si-H bonding configurations of hydrogenated amorphous silicon filmsJ. Acta Physica Sinica, 2003, 52(1): 169-174. DOI: 10.7498/aps.52.169
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Citation:
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Luo Zhi, Lin Xuan-Ying, Lin Shun-Hui, Yu Chu-Ying, Lin Kui-Xun, Yu Yun-Peng, Tan Wei-Feng. Infrared analysis on hydrogen content and Si-H bonding configurations of hydrogenated amorphous silicon filmsJ. Acta Physica Sinica, 2003, 52(1): 169-174. DOI: 10.7498/aps.52.169
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