Numerical simulation of the evolution of highly charged ions in an electron-bea m ion trap

Yuan Xing-Qiu; Chen Chong-Yang; Li Hui; Zhao Tai-Zhe; Guo Wen-Kang; Xu Ping

doi:10.7498/aps.52.1906

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Yuan Xing-Qiu, Chen Chong-Yang, Li Hui, Zhao Tai-Zhe, Guo Wen-Kang, Xu Ping. Numerical simulation of the evolution of highly charged ions in an electron-bea m ion trapJ. Acta Physica Sinica, 2003, 52(8): 1906-1910. DOI: 10.7498/aps.52.1906

Citation:

Yuan Xing-Qiu, Chen Chong-Yang, Li Hui, Zhao Tai-Zhe, Guo Wen-Kang, Xu Ping. Numerical simulation of the evolution of highly charged ions in an electron-bea m ion trapJ. Acta Physica Sinica, 2003, 52(8): 1906-1910. DOI: 10.7498/aps.52.1906

Citation:

Yuan Xing-Qiu, Chen Chong-Yang, Li Hui, Zhao Tai-Zhe, Guo Wen-Kang, Xu Ping. Numerical simulation of the evolution of highly charged ions in an electron-bea m ion trapJ. Acta Physica Sinica, 2003, 52(8): 1906-1910. DOI: 10.7498/aps.52.1906