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中国物理学会期刊
Wang Liu-Jiu, Zhu Mei-Fang, Liu Feng-Zhen, Liu Jin-Long, Han Yi-Qin. Structual and optoelectronic properties of polycrystalline silicon thin films p repared by hot-wire chemical vapor deposition at low temperaturesJ. Acta Physica Sinica, 2003, 52(11): 2934-2938. DOI: 10.7498/aps.52.2934
Citation: Wang Liu-Jiu, Zhu Mei-Fang, Liu Feng-Zhen, Liu Jin-Long, Han Yi-Qin. Structual and optoelectronic properties of polycrystalline silicon thin films p repared by hot-wire chemical vapor deposition at low temperaturesJ. Acta Physica Sinica, 2003, 52(11): 2934-2938. DOI: 10.7498/aps.52.2934

Structual and optoelectronic properties of polycrystalline silicon thin films p repared by hot-wire chemical vapor deposition at low temperatures

CSTR: 32037.14.aps.52.2934
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