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中国物理学会期刊
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Liu Xue-Rong, Hu Bo, Liu Wen-Han, Gao Chen. The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopyJ. Acta Physica Sinica, 2003, 52(1): 34-38. DOI: 10.7498/aps.52.34
Citation: Liu Xue-Rong, Hu Bo, Liu Wen-Han, Gao Chen. The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopyJ. Acta Physica Sinica, 2003, 52(1): 34-38. DOI: 10.7498/aps.52.34
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The theoretical calibration coefficient in the measurement of nonlinear dielectric constant with a scanning tip microwave near-field microscopy

Acta Phys. Sin., 2003, 52(1): 34-38.
DOI: 10.7498/aps.52.34
CSTR: 32037.14.aps.52.34
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