Study of tip-sample contact process and phase contrast in tapping mode atomic force microscopy

Wang Xiao-Ping; Liu Lei; Hu Hai-Long; Zhang Kun

doi:10.7498/aps.53.1008

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Wang Xiao-Ping, Liu Lei, Hu Hai-Long, Zhang Kun. Study of tip-sample contact process and phase contrast in tapping mode atomic force microscopyJ. Acta Physica Sinica, 2004, 53(4): 1008-1014. DOI: 10.7498/aps.53.1008

Citation:

Wang Xiao-Ping, Liu Lei, Hu Hai-Long, Zhang Kun. Study of tip-sample contact process and phase contrast in tapping mode atomic force microscopyJ. Acta Physica Sinica, 2004, 53(4): 1008-1014. DOI: 10.7498/aps.53.1008

Citation:

Wang Xiao-Ping, Liu Lei, Hu Hai-Long, Zhang Kun. Study of tip-sample contact process and phase contrast in tapping mode atomic force microscopyJ. Acta Physica Sinica, 2004, 53(4): 1008-1014. DOI: 10.7498/aps.53.1008