He Chao-Hui, Geng Bin, He Bao-Ping, Yao Yu-Juan, Li Yong-Hong, Peng Hong-Lun, Lin Dong-Sheng, Zhou Hui, Chen Yu-Sheng. Test methods of total dose effects in verylarge scale integrated circuitsJ. Acta Physica Sinica, 2004, 53(1): 194-199. DOI: 10.7498/aps.53.194
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Citation:
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He Chao-Hui, Geng Bin, He Bao-Ping, Yao Yu-Juan, Li Yong-Hong, Peng Hong-Lun, Lin Dong-Sheng, Zhou Hui, Chen Yu-Sheng. Test methods of total dose effects in verylarge scale integrated circuitsJ. Acta Physica Sinica, 2004, 53(1): 194-199. DOI: 10.7498/aps.53.194
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He Chao-Hui, Geng Bin, He Bao-Ping, Yao Yu-Juan, Li Yong-Hong, Peng Hong-Lun, Lin Dong-Sheng, Zhou Hui, Chen Yu-Sheng. Test methods of total dose effects in verylarge scale integrated circuitsJ. Acta Physica Sinica, 2004, 53(1): 194-199. DOI: 10.7498/aps.53.194
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Citation:
|
He Chao-Hui, Geng Bin, He Bao-Ping, Yao Yu-Juan, Li Yong-Hong, Peng Hong-Lun, Lin Dong-Sheng, Zhou Hui, Chen Yu-Sheng. Test methods of total dose effects in verylarge scale integrated circuitsJ. Acta Physica Sinica, 2004, 53(1): 194-199. DOI: 10.7498/aps.53.194
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