Determination of bandgap in SiGe strained layers using a pn heterojunction C-V

Shu Bin; Dai Xian-Ying; Zhang He-Ming

doi:10.7498/aps.53.235

Shu Bin, Dai Xian-Ying, Zhang He-Ming. Determination of bandgap in SiGe strained layers using a pn heterojunction C-VJ. Acta Physica Sinica, 2004, 53(1): 235-238. DOI: 10.7498/aps.53.235

Citation:

Shu Bin, Dai Xian-Ying, Zhang He-Ming. Determination of bandgap in SiGe strained layers using a pn heterojunction C-VJ. Acta Physica Sinica, 2004, 53(1): 235-238. DOI: 10.7498/aps.53.235

Citation:

Shu Bin, Dai Xian-Ying, Zhang He-Ming. Determination of bandgap in SiGe strained layers using a pn heterojunction C-VJ. Acta Physica Sinica, 2004, 53(1): 235-238. DOI: 10.7498/aps.53.235