A unified model for 1/f noise in n-channel and p-channel MOSFETs

Bao Jun-Lin; Zhuang Yi-Qi; Du Lei; Li Wei-Hua; Wan Chang-Xing; Zhang Ping

doi:10.7498/aps.54.2118

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Bao Jun-Lin, Zhuang Yi-Qi, Du Lei, Li Wei-Hua, Wan Chang-Xing, Zhang Ping. A unified model for 1/f noise in n-channel and p-channel MOSFETsJ. Acta Physica Sinica, 2005, 54(5): 2118-2122. DOI: 10.7498/aps.54.2118

Citation:

Bao Jun-Lin, Zhuang Yi-Qi, Du Lei, Li Wei-Hua, Wan Chang-Xing, Zhang Ping. A unified model for 1/f noise in n-channel and p-channel MOSFETsJ. Acta Physica Sinica, 2005, 54(5): 2118-2122. DOI: 10.7498/aps.54.2118

Citation:

Bao Jun-Lin, Zhuang Yi-Qi, Du Lei, Li Wei-Hua, Wan Chang-Xing, Zhang Ping. A unified model for 1/f noise in n-channel and p-channel MOSFETsJ. Acta Physica Sinica, 2005, 54(5): 2118-2122. DOI: 10.7498/aps.54.2118