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中国物理学会期刊
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Tao Yong-Mei, Jiang Qing, Cao Hai-Xia. Impact of stress on the thermodynamic properties of ferroelectric films within the transverse Ising modelJ. Acta Physica Sinica, 2005, 54(1): 274-279. DOI: 10.7498/aps.54.274
Citation: Tao Yong-Mei, Jiang Qing, Cao Hai-Xia. Impact of stress on the thermodynamic properties of ferroelectric films within the transverse Ising modelJ. Acta Physica Sinica, 2005, 54(1): 274-279. DOI: 10.7498/aps.54.274
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Impact of stress on the thermodynamic properties of ferroelectric films within the transverse Ising model

Acta Phys. Sin., 2005, 54(1): 274-279.
DOI: 10.7498/aps.54.274
CSTR: 32037.14.aps.54.274
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