Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometer

Mu Quan-Quan; Liu Yong-Jun; Hu Li-Fa; Li Da-Yu; Cao Zhao-Liang; Xuan Li

doi:10.7498/aps.55.1055

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Mu Quan-Quan, Liu Yong-Jun, Hu Li-Fa, Li Da-Yu, Cao Zhao-Liang, Xuan Li. Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometerJ. Acta Physica Sinica, 2006, 55(3): 1055-1060. DOI: 10.7498/aps.55.1055

Citation:

Mu Quan-Quan, Liu Yong-Jun, Hu Li-Fa, Li Da-Yu, Cao Zhao-Liang, Xuan Li. Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometerJ. Acta Physica Sinica, 2006, 55(3): 1055-1060. DOI: 10.7498/aps.55.1055

Citation:

Mu Quan-Quan, Liu Yong-Jun, Hu Li-Fa, Li Da-Yu, Cao Zhao-Liang, Xuan Li. Determination of anisotropic liquid crystal layer parameters by spectroscopic ellipsometerJ. Acta Physica Sinica, 2006, 55(3): 1055-1060. DOI: 10.7498/aps.55.1055