Search

x
中国物理学会期刊
Advanced Search
Hu Jin, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, Zhou Jiang. Noise as a representation for reliability of light emitting diodeJ. Acta Physica Sinica, 2006, 55(3): 1384-1389. DOI: 10.7498/aps.55.1384
Citation: Hu Jin, Du Lei, Zhuang Yi-Qi, Bao Jun-Lin, Zhou Jiang. Noise as a representation for reliability of light emitting diodeJ. Acta Physica Sinica, 2006, 55(3): 1384-1389. DOI: 10.7498/aps.55.1384
shu

Noise as a representation for reliability of light emitting diode

Acta Phys. Sin., 2006, 55(3): 1384-1389.
DOI: 10.7498/aps.55.1384
CSTR: 32037.14.aps.55.1384
PDF
导出引用

  • Abstract

    Authors and contacts

    References

Turn off MathJax
Article Contents

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return