Search

x
中国物理学会期刊
Advanced Search
Li Jing, Liu Hong-Xia, Hao Yue. Study on self-healing effect in ultra deep submicron PMOSFET’sJ. Acta Physica Sinica, 2006, 55(5): 2508-2512. DOI: 10.7498/aps.55.2508
Citation: Li Jing, Liu Hong-Xia, Hao Yue. Study on self-healing effect in ultra deep submicron PMOSFET’sJ. Acta Physica Sinica, 2006, 55(5): 2508-2512. DOI: 10.7498/aps.55.2508
shu

Study on self-healing effect in ultra deep submicron PMOSFET’s

Acta Phys. Sin., 2006, 55(5): 2508-2512.
DOI: 10.7498/aps.55.2508
CSTR: 32037.14.aps.55.2508
PDF
导出引用

  • Abstract

    Authors and contacts

    References

Turn off MathJax
Article Contents

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return