Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation

Hou Hai-Hong; Sun Xi-Lian; Shen Yan-Ming; Shao Jian-Da; Fan Zheng-Xiu; Yi Kui

doi:10.7498/aps.55.3124

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Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui. Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporationJ. Acta Physica Sinica, 2006, 55(6): 3124-3127. DOI: 10.7498/aps.55.3124

Citation:

Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui. Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporationJ. Acta Physica Sinica, 2006, 55(6): 3124-3127. DOI: 10.7498/aps.55.3124

Citation:

Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui. Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporationJ. Acta Physica Sinica, 2006, 55(6): 3124-3127. DOI: 10.7498/aps.55.3124