Investigation on stability of microcrystalline silicon thin film transistors

Li Juan; Wu Chun-Ya; Zhao Shu-Yun; Liu Jian-Ping; Meng Zhi-Guo; Xiong Shao-Zhen; Zhang Fang

doi:10.7498/aps.55.6612

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Li Juan, Wu Chun-Ya, Zhao Shu-Yun, Liu Jian-Ping, Meng Zhi-Guo, Xiong Shao-Zhen, Zhang Fang. Investigation on stability of microcrystalline silicon thin film transistorsJ. Acta Physica Sinica, 2006, 55(12): 6612-6616. DOI: 10.7498/aps.55.6612

Citation:

Li Juan, Wu Chun-Ya, Zhao Shu-Yun, Liu Jian-Ping, Meng Zhi-Guo, Xiong Shao-Zhen, Zhang Fang. Investigation on stability of microcrystalline silicon thin film transistorsJ. Acta Physica Sinica, 2006, 55(12): 6612-6616. DOI: 10.7498/aps.55.6612

Citation:

Li Juan, Wu Chun-Ya, Zhao Shu-Yun, Liu Jian-Ping, Meng Zhi-Guo, Xiong Shao-Zhen, Zhang Fang. Investigation on stability of microcrystalline silicon thin film transistorsJ. Acta Physica Sinica, 2006, 55(12): 6612-6616. DOI: 10.7498/aps.55.6612