Measurement of carrier-envelope phase of few cycles Ti:sapphire laser by difference frequency technique

Han Hai_Nian; Zhao Yan_Ying; Zhang Wei; Zhu Jiang_Feng; Wang Peng; Wei Zhi_Yi; Li Shi_Qun

doi:10.7498/aps.56.2756

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Han Hai_Nian, Zhao Yan_Ying, Zhang Wei, Zhu Jiang_Feng, Wang Peng, Wei Zhi_Yi, Li Shi_Qun. Measurement of carrier-envelope phase of few cycles Ti:sapphire laser by difference frequency techniqueJ. Acta Physica Sinica, 2007, 56(5): 2756-2759. DOI: 10.7498/aps.56.2756

Citation:

Han Hai_Nian, Zhao Yan_Ying, Zhang Wei, Zhu Jiang_Feng, Wang Peng, Wei Zhi_Yi, Li Shi_Qun. Measurement of carrier-envelope phase of few cycles Ti:sapphire laser by difference frequency techniqueJ. Acta Physica Sinica, 2007, 56(5): 2756-2759. DOI: 10.7498/aps.56.2756

Citation:

Han Hai_Nian, Zhao Yan_Ying, Zhang Wei, Zhu Jiang_Feng, Wang Peng, Wei Zhi_Yi, Li Shi_Qun. Measurement of carrier-envelope phase of few cycles Ti:sapphire laser by difference frequency techniqueJ. Acta Physica Sinica, 2007, 56(5): 2756-2759. DOI: 10.7498/aps.56.2756